NIR PAT in a Tablet Press Feed Frame
The second webinar in our new series focused on NIR-based Process Analytical Technology (PAT) will focus on NIR-based Process Analytical Technology (PAT) for measurements in the feed frame of a tablet press.
This webinar will present an overview of NIR-based PAT solutions for monitoring blend uniformity in a feed frame of a tablet press. This will include an overview of the fundamentals of NIR-based PAT, which provides critical context for its practical implementation. Then, many aspects of NIR PAT implementation in a feed frame will be discussed, including an application developed with the SentroPAT FO and it's comparison with the SentroPAT Compact.
In this second webinar, we will also address potential business considerations for applying NIR based PAT in this unit operation. Obviously, those considerations could also be relevant for discussions with stakeholders who are hesitant to implement PAT.
| Where: | Online Webinar - Link will be shared after registration and prior to the webinar |
When:
| December 11, 2025 08:30 - 09:30 Eastern Standard Time 14:30 - 15:30 Central European Time 18:00 - 19:00 Indian Standard Time 20:30 - 21:30 China Standard Time |
Speaker and Representatives
Owen Rehrauer, President Sentronic US Corp., Presenter
Adam J. Rish, Scientist at Sentronic US Corp., Presenter
Dr. Hubertus Rehbaum, Moderator
Uwe Kirschner. CEO Sentronic GmbH, Representative
Sebastian Sowinski, Key Account Manager Sentronic GmbH, Representative