Webinar on NIR based PAT for Bin Blending
The inaugural webinar in our new series focused on NIR-based Process Analytical Technology (PAT) will focus on NIR-based Process Analytical Technology (PAT) for bin blending applications.
This webinar will present an overview of NIR-based PAT solutions for bin blending. This will include an overview of the fundamentals of NIR-based PAT, which provides critical context for its practical implementation. Then, all aspects of NIR PAT implementation in bin blending will be presented, including an application developed with the SentroPAT DA.
The first SentroConnect webinar will also introduce the analytical techniques used to extract meaningful process information from spectral data. We’ll conclude with an open Q&A session, giving participants the opportunity to ask questions and engage directly with our experts.

Where: | Online Webinar - Link will be shared after registration and prior to the webinar |
When:
| September 30, 2025 08:30 - 09:30 Eastern Standard Time 14:30 - 15:30 Central European Time 18:00 - 19:00 Indian Standard Time 20:30 - 21:30 China Standard Time |
Speaker and Representatives

Owen Rehrauer, President Sentronic US Corp., Presenter

Adam J. Rish, Scientist at Sentronic US Corp., Presenter

Dr. Hubertus Rehbaum, Moderator

Uwe Kirschner. CEO Sentronic GmbH, Representative

Sebastian Sowinski, Key Account Manager Sentronic GmbH, Representative